Optical and Electrical Properties of Antimony and Fluorine Doped Tin Oxide Thin Films

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Optical and Electrical Properties of Nitrogen Ion Implanted Fluorine Doped Tin Oxide Films

Tin oxide films were implanted with N at various energies between 5 to 40 keV for different ion doses between 10 to 10 cm. The microstructure, optical and electrical properties of the films were investigated. From Transmission Electron Microscopy the implanted films were shown to be amorphous. The implanted thickness for the 10 keV and 40 keV were found to be 30 nm and 110 nm, respectively. The...

متن کامل

Antimony-doped Tin(II) Sulfide Thin Films

Thin-film solar cells made from earth-abundant, inexpensive, and non-toxic materials are needed to replace the current technologies whose widespread use is limited by their use of scarce, costly, and toxic elements. Tin monosulfide (SnS) is a promising candidate for making absorber layers in scalable, inexpensive, and non-toxic solar cells. SnS has always been observed to be a p-type semiconduc...

متن کامل

Structural, Electrical and Optical Properties of Molybdenum Oxide Thin Films Prepared by Post-annealing of Mo Thin Films

Molybdenum thin films with 50 and 150 nm thicknesses were deposited on silicon substrates, using DC magnetron sputtering system, then post-annealed at different temperatures (200, 325, 450, 575 and 700°C) with flow oxygen at 200 sccm (standard Cubic centimeter per minute). The crystallographic structure of the films was obtained by means of x-ray diffraction (XRD) analysis. An atomic force micr...

متن کامل

Structural and electrical properties of In-doped vanadium oxide thin films prepared by spray pyrolysis

The In-doped vanadium pentoxide nanostructures with different doping levels including 0, 10, 20 and 30 at.% were prepared by the spray pyrolysis technique. The prepared thin films were characterized by the x-ray diffraction (XRD) and scanning electron microscopy (SEM). The XRD results revealed that the films were crystalline in tetragonal phase. Increasing the In-doping level made the structure...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Universal Journal of Physics and Application

سال: 2017

ISSN: 2331-6535,2331-6543

DOI: 10.13189/ujpa.2017.110304